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VLSI reliability / Anant G. Sabnis.

By: Sabnis, Anant GMaterial type: TextTextSeries: VLSI electronics ; v. 22Publication details: San Diego : Academic Press, 1990. Description: xiii, 207 p. : ill. ; 24 cmISBN: 0122341228 (alk. paper)Subject(s): Integrated circuits -- Very large scale integration -- ReliabilityDDC classification: 621.39/5 s | 621.39/5 LOC classification: TK7874 | .V56 vol. 22
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Item type Current library Call number Status Date due Barcode
Book UDOM Library - Collection of Informatics and Virtual Education
TK7874 .V56 vol. 22 (Browse shelf(Opens below)) Available 2717

Includes bibliographical references and index.

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