TY  - BOOK
AU  - Sabnis,Anant G.
TI  - VLSI reliability
SN  - 0122341228 (alk. paper)
AV  - TK7874 .V56 vol. 22
U1  - 621.39/5 s621.39/5 20
PY  - 1990///
CY  - San Diego
PB  - Academic Press
KW  - Integrated circuits
KW  - Very large scale integration
KW  - Reliability
N1  - Includes bibliographical references and index
ER  -