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		E-learning by design / William Horton. by Horton, William K. (William Kendall). Material type: Text; Format: print ; Literary form: Not fiction Publication details: San Francisco : Pfeiffer, 2006Online access: Table of contents only \| Publisher description \| Contributor biographical information Availability: Items available for loan: UDOM Library - Collection of Informatics and Virtual Education (4)Call number: HF 5549.5 .T7H63 2006, ... Add to cart (remove)
		No cover image available Materials reliability in microelectronics : symposium held ... Series: Materials Research Society symposia proceedingsMaterial type: Continuing resource; Format: print Publication details: Pittsburgh, Pa. : Materials Research Society, c1992-Availability: Items available for loan: UDOM Library - Collection of Informatics and Virtual Education (1)Call number: TK7874 .M344251991. Add to cart (remove)
		Reliability, yield, and stress burn-in : a unified approach for microelectronics systems manufacturing & software development / by Way Kuo, Wei-Ting Kary Chien, Taeho Kim. by Kuo, Way, 1951- \| Chien, Wei-Ting Kary, 1965- \| Kim, Taeho, 1960-. Material type: Text; Format: print ; Literary form: Not fiction Publication details: Boston, Mass : Kluwer Academic Publishers, c1998Online access: Publisher description \| Table of contents only Availability: Items available for loan: UDOM Library - Collection of Informatics and Virtual Education (1)Call number: TK7874 .K867 1998. Add to cart (remove)
		Microsoft Commerce Solutions Material type: Text Publication details: Washinghton: ; Microsoft Press ; 1999Availability: No items available. Add to cart (remove)

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