VLSI reliability / Anant G. Sabnis.
Material type:
TextSeries: VLSI electronics ; v. 22Publication details: San Diego : Academic Press, 1990. Description: xiii, 207 p. : ill. ; 24 cmISBN: 0122341228 (alk. paper)Subject(s): Integrated circuits -- Very large scale integration -- ReliabilityDDC classification: 621.39/5 s | 621.39/5 LOC classification: TK7874 | .V56 vol. 22
| Item type | Current library | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
| Book | UDOM Library - Collection of Informatics and Virtual Education | TK7874 .V56 vol. 22 (Browse shelf(Opens below)) | Available | 2717 |
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| TK7874 V56 1982 VLSI electronics: microstructure science/ | TK7874 .V56 1989 VLSI and computer architecture / | TK7874 .V56 1991 Application specific integrated circuit (ASIC) technology / edited by Norman G. Einspruch, Jeffrey L. Hilbert. | TK7874 .V56 vol. 22 VLSI reliability / | TK7874 .V564 1988 VLSI specification, verification, and synthesis / | TK7874 .W48 1987 Relaxation techniques for the simulation of VLSI circuits / | TK7874 .W635 1986 Silicon processing for the VLSI era / |
Includes bibliographical references and index.
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